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AFRL interns showcase their work in annual poster session at Wright-Patterson

The in-person poster sessions meant masks and social distancing because of COVID-19. (U.S. Air Force photo/Micah Hung)
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AFRL interns showcase their work in annual poster session at Wright-Patterson

Wright State University student intern Alexander Vehre explains his poster. Vehre is an undergraduate majoring in mechanical engineering. (U.S. Air Force photo/Micah Hung)
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Capt. Cristian Hernández-Rivera’s wife, Joanne Ortiz Merced, places his new Space Force insignia on his sleeve. (U.S. Air Force photo/Spencer Deer)
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From left to right, AFRL Vice Commander Col. Paul Henderson, Materials and Manufacturing Directorate Chief Scientist Dr. Richard Vaia, and Deputy Director Col. Michael Warner cut the ribbon to open the renovated Materials Characterization Facility at Wright-Patterson Air Force Base. (U.S. Air Force photo/Spencer Deer)
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Because of the COVID-19 pandemic, 2021’s ceremony was held virtually. Recipients, shown clockwise from upper left, are: Doyle Edwards, Dr. Joey Mead, Dr. Jeremy Ward and Dr. Courtney Taylor. (Photo courtesy of Nextflex)
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Testing done at Wright-Patterson made Perseverance and the search for life on Mars possible

This image taken by NASA’s Mars 2020 Perseverance shows tracks from the rover’s first drive. It also shows an area that was scoured clean by the craft’s descent stage rockets — the lighter-colored area shown near the center-top. Testing done at AFRL’s Materials and Manufacturing ensured the landing craft’s protective coating would survive being blasted by that debris. (Photo courtesy of NASA)
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AFRL partners with Cornell to use micro-beam scanning technology for inspecting composite materials

During COVID-19 restrictions, the research team established protocols and routines that allow remote sample manipulation and data acquisition. From left to right: Dr. Hilmar Koerner, Cornell staff scientists Drs. Louisa Smieska and Arthur Woll, and AFRL Materials and Manufacturing research scientists Dr. Edward Trigg and Mr. Andrew Abbott. The black command window with code lines (upper left) shows the UNIX-based software package for instrument control and data collection SPEC. Users can run their own software packages written in the programming language python to position the sample stage and to program automated sample movement. The camera image (AXIS) in upper right shows a close-up of the sample stage in the beamline hutch. While beamline staff mount the samples, everything else is being done remotely from the comfort of either office or home. (Courtesy photo)
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A sample is loaded into the Bruker Atomic Force Microscope system capable of performing nanoscale imaging experiments. (U.S. Air Force photo/Spencer Deer)
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Dr. Richard A. Vaia, Chief Scientist at AFRL's Materials and Manufacturing Directorate, is a member of the National Academy of Engineering Class of 2020. (U.S. Air Force photo)
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