Skip to main content (Press Enter).
U.S. Air Force Logo
Home
News
News Stories
Photos
About Us
Biographies
Fact Sheets
Security and Policy Review
Technology Directorates
711th Human Performance Wing (711HPW)
Human Effectiveness (RH)
USAFSAM
DIMO
OGME
Aerospace Systems (RQ)
Air Force Office of Scientific Research (AFOSR)
AFWERX (RG)
Directed Energy (RD)
Information (RI)
Integrated Capabilities (RS)
Materials & Manufacturing (RX)
Munitions (RW)
Sensors (RY)
Space Vehicles (RV)
Organizations
AF Small Business (SBIR/STTR)
AFRL Small Business
Autonomy Capability Team (ACT3)
D'Azzo Research Library
Digital Capabilities (ID)
Technology Transfer
Contact Us
WIN THE FUTURE
NEWS
CAREERS
AFRL TECH
About AFRL
Contact Us
ImageGallery
Search
Search
All Images
All Images
Other
Upload Date
Upload Date
Photo Date
Title
Share
201216-F-TH808-1001.PNG
Atomic scale images (images are 40 micrometers x 40 micrometers) of surface height, surface potential and surface dielectric, in two-dimensional MoSe2 films, revealing many features invisible to traditional characterization methods. (U.S. Air Force photo/Spencer Deer)
Download Image:
Full Size (0.23 MB)
Tags:
AFRL
,
Atomic scale images
Photo by:
U.S. Air Force Image/Spencer Deer |
VIRIN:
201216-F-TH808-1001.PNG
Photo Gallery